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DAC
1999
ACM
14 years 26 days ago
IC Test Using the Energy Consumption Ratio
Dynamic-current based test techniques can potentially address the drawbacks of traditional and Iddq test methodologies. The quality of dynamic current based test is degraded by pr...
Wanli Jiang, Bapiraju Vinnakota
VTS
1999
IEEE
106views Hardware» more  VTS 1999»
14 years 25 days ago
RT-level TPG Exploiting High-Level Synthesis Information
High-level test pattern generation is today a widely investigated research topic. The present paper proposes a fully automated, simulation-based ATPG system, to address test patte...
Silvia Chiusano, Fulvio Corno, Paolo Prinetto
DATE
2008
IEEE
121views Hardware» more  DATE 2008»
14 years 3 months ago
A Bridging Fault Model Where Undetectable Faults Imply Logic Redundancy
We define a robust fault model as a model where the existence of an undetectable fault implies the existence of logic redundancy, or more generally, a suboptimality in the synthe...
Irith Pomeranz, Sudhakar M. Reddy
SIGADA
2001
Springer
14 years 1 months ago
Automating software module testing for FAA certification
Automatic software testing is gradually becoming accepted practice in the software industry. The shrinking development cycle and higher expectation of software quality are forcing...
Usha Santhanam
CHI
2007
ACM
14 years 9 months ago
Usability testing: what have we overlooked?
For more than a decade, the number of usability test participants has been a major theme of debate among usability practitioners and researchers keen to improve usability test per...
Gitte Lindgaard, Jarinee Chattratichart