2129 search results - page 24 / 426 » Cutting-Edge Timing Analysis Techniques |
DAC
2004
ACM
14 years 11 months ago
2004
ACM
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
DAC
2007
ACM
14 years 12 months ago
2007
ACM
An effective method for focusing optimization effort on the most important parts of a design is to examine those elements on the critical path. Traditionally, the critical path is...
EMSOFT
2009
Springer
14 years 5 months ago
2009
Springer
This paper advocates a strict compositional and hybrid approach for obtaining key (performance) metrics of embedded At its core the developed methodology abstracts system componen...
ICCAD
1999
IEEE
14 years 3 months ago
1999
IEEE
Partially depleted silicon-on-insulator (PD-SOI) has emerged as a technology of choice for high-performance low-power deep-submicrometer digital integrated circuits. An important c...
DAC
2007
ACM
14 years 12 months ago
2007
ACM
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...