- A Cyclic-CPRS (Column Parity Row Selection) technique is presented to diagnose built-in self tested (BISTed) circuits, even in the presence of many unknowns and transient errors....
Chun-Yi Lee, Hung-Mao Lin, Fang-Min Wang, James Ch...
This article presents an in-circuit emulation (ICE) module that can be embedded with a microprocessr core. The ICE module, based on the IEEE 1149.1 JTAG architecture, supports typ...
In the last decade, researchers have devoted increasing efforts to reduce the average power consumption in VLSI systems during normal operation mode, while power consumption durin...
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Xiji...
f abstraction as applicable to break the problem's complexity, and innovating better techniques to address complexity of new microarchitectural features. Validation techniques...