25 search results - page 5 / 5 » DFFT : Design For Functional Testability |
ISQED
2006
IEEE
14 years 1 months ago
2006
IEEE
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...
DSD
2005
IEEE
14 years 1 months ago
2005
IEEE
We describe a new e-learning environment and a runtime platform for educational tools on digital system testing and design for testability. This environment is being developed in ...
ICSE
2003
IEEE-ACM
14 years 27 days ago
2003
IEEE-ACM
Software-intensive systems often exhibit dimensions in size and complexity that exceed the scope of comprehension of even talented, experienced system designers and analysts. With ...
DAC
2003
ACM
14 years 8 months ago
2003
ACM
Software-based self-test (SBST) is an emerging approach to address the challenges of high-quality, at-speed test for complex programmable processors and systems-on chips (SoCs) th...
GLVLSI
2002
IEEE
14 years 19 days ago
2002
IEEE
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...