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114
Voted
DATE
2007
IEEE
15 years 10 months ago
2007
IEEE
RFIC reliability is fast becoming a major bottleneck in the yield and performance of modern IC systems, as process complexity and levels of integration continually increase. Due t...
97
Voted
DATE
2007
IEEE
15 years 10 months ago
2007
IEEE
High reliability against noise, low energy consumption and high performance are key objectives in the design of on-chip networks. Recently some researchers have considered the var...
97
Voted
DATE
2006
IEEE
15 years 9 months ago
2006
IEEE
Resonant clocking holds the promise of trading speed for energy in CMOS circuits that can afford to operate at low frequency, like hearing aids. An experimental chip with 110k tra...
128
Voted
DATE
2006
IEEE
15 years 9 months ago
2006
IEEE
We present a coverage metric which evaluates the testing of a set of interacting concurrent processes. Existing behavioral coverage metrics focus almost exclusively on the testing...
124
Voted
DATE
2006
IEEE
15 years 9 months ago
2006
IEEE
Most of the challenges related to the development of multi-processor platforms for complex wireless and multimedia applications fall into the Electronic System Level (ESL) domain....