67 search results - page 6 / 14 » Defect Aware Test Patterns |
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
PICS
2003
13 years 8 months ago
2003
This study examines the prediction of print defect perception (banding) of the human visual system (HVS) by combining detection probabilities of contrast components from wavelet a...
VTS
2008
IEEE
14 years 1 months ago
2008
IEEE
With increasing IC process variation and increased operating speed, it is more likely that even subtle defects will lead to the malfunctioning of a circuit. Various fault models, ...
DAC
2000
ACM
14 years 8 months ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
IWANN
1995
Springer
13 years 11 months ago
1995
Springer
This paper presents a comparative analysis of neural networks, simulated annealing, and genetic algorithms in the determination of input patterns for testing analog circuits. The ...