41 search results - page 2 / 9 » Defect Tolerance in Multiple-FPGA Systems |
FCCM
2006
IEEE
14 years 2 months ago
2006
IEEE
We propose a novel defect-tolerant design methodology using Bloom filters for defect mapping for nanoscale computing devices. It is a general approach that can be used for any pe...
DFT
2008
IEEE
14 years 3 months ago
2008
IEEE
Tolerating defects and fabrication variations will be critical in any system made with devices that have nanometer feature sizes. This paper considers how fabrication variations a...
CODES
2008
IEEE
13 years 10 months ago
2008
IEEE
It is well recognized that novel computational models, devices and technologies are needed in order to sustain the remarkable advancement of CMOS-based VLSI circuits and systems. ...
ICCD
2003
IEEE
14 years 5 months ago
2003
IEEE
Continued advancements in fabrication technology and reductions in feature size create challenges in maintaining both manufacturing yield rates and long-term reliability of device...
TC
1998
13 years 8 months ago
1998
—The very high levels of integration and submicron device sizes used in current and emerging VLSI technologies for FPGAs lead to higher occurrences of defects and operational fau...