We propose a novel defect-tolerant design methodology using Bloom filters for defect mapping for nanoscale computing devices. It is a general approach that can be used for any pe...
Tolerating defects and fabrication variations will be critical in any system made with devices that have nanometer feature sizes. This paper considers how fabrication variations a...
Michael T. Niemier, Michael Crocker, Xiaobo Sharon...
It is well recognized that novel computational models, devices and technologies are needed in order to sustain the remarkable advancement of CMOS-based VLSI circuits and systems. ...
Xiaobo Sharon Hu, Alexander Khitun, Konstantin K. ...
Continued advancements in fabrication technology and reductions in feature size create challenges in maintaining both manufacturing yield rates and long-term reliability of device...
Premkishore Shivakumar, Stephen W. Keckler, Charle...
—The very high levels of integration and submicron device sizes used in current and emerging VLSI technologies for FPGAs lead to higher occurrences of defects and operational fau...