2 search results - page 1 / 1 » Defect aware X-filling for low-power scan testing |
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
Various X-filling methods have been proposed for reducing the shift and/or capture power in scan testing. The main drawback of these methods is that X-filling for low power leads t...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
Ultra low-power devices are being developed for embedded applications in bio-medical electronics, wireless sensor networks, environment monitoring and protection, etc. The testing...