This paper argues that the existing approaches to modeling and characterization of IC malfunctions are inadequate for test and yield learning of Deep Sub-Micron (DSM) products. Tr...
Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Tho...
Defect density and defect size distributions (DDSDs) are key parameters used in IC yield loss predictions. Traditionally, memories and specialized test structures have been used t...
Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jas...
In this paper we present a new method for estimating confidence and curvature of 3-D curvilinear structures. The gradient structure tensor (GST) models shift-invariance. The eigen...
In this paper we present the Dynamic Grow-Shrink Inference-based Markov network learning algorithm (abbreviated DGSIMN), which improves on GSIMN, the state-ofthe-art algorithm for...
Multi-modal image registration is a challenging problem in medical imaging. The goal is to align anatomically identical structures; however, their appearance in images acquired wit...