90 search results - page 12 / 18 » Design, Implementation, and Validation of a New Class of Int... |
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
DAC
2008
ACM
14 years 8 months ago
2008
ACM
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...
CACM
2000
13 years 7 months ago
2000
Wireless Integrated Network Sensors (WINS) now provide a new monitoring and control capability for transportation, manufacturing, health care, environmental monitoring, and safety...
VLSID
2004
IEEE
14 years 8 months ago
2004
IEEE
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
ECOOP
2000
Springer
13 years 12 months ago
2000
Springer
Abstract. In this paper we present Jam, an extension of the Java language supporting mixins, that is, parametric heir classes. A mixin declaration in Jam is similar to a Java heir ...