This paper presents a new Design for Testability (DFT) technique for Current-Mode Logic (CML) circuits. This new technique, with little overhead, using built-in detectors, monitor...
Bernard Antaki, Yvon Savaria, Nanhan Xiong, Saman ...
Testability is one of the most important factors that are considered during design cycle along with reliability, speed, power consumption, cost and other factors important for a c...
Improving testability during the early stages of High-level synthesis has several advantages including reduced test hardware overhead and design iterations. Recently, BIST techniq...
Improving testability during the early stages of High-Level Synthesis (HLS) has several benefits, including reduced test hardware overhead, reduced test costs, reduced design iter...
Saeed Safari, Hadi Esmaeilzadeh, Amir-Hossein Jaha...
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
Saeed Safari, Amir-Hossein Jahangir, Hadi Esmaeilz...