123 search results - page 14 / 25 » Design For Testability Method for CML Digital Circuits |
FMCAD
2007
Springer
13 years 11 months ago
2007
Springer
Abstract--Analog and mixed signal (AMS) designs are important integrated circuits that are usually needed at the interface between the electronic system and the real world. Recentl...
ICCAD
2001
IEEE
14 years 4 months ago
2001
IEEE
: This paper describes ASF, a novel cell-level analog synthesis framework that can size and bias a given circuit topology subject to a set of performance objectives and a manufactu...
ICCAD
1998
IEEE
13 years 12 months ago
1998
IEEE
Noise can cause digital circuits to switch incorrectly and thus produce spurious results. Noise can also have adverse power, timing and reliability e ects. Dynamic logic is partic...
DATE
2000
IEEE
14 years 3 days ago
2000
IEEE
An objective of DSP testing should be to ensure that any errors due to missed faults are infrequent compared to a circuit’s intrinsic errors, such as overflow. A method is prop...
IJCSS
2007
13 years 7 months ago
2007
This paper presents a low power driven synthesis framework for the unique class of nonregenerative Boolean Read-Once Functions (BROF). A two-pronged approach is adopted, where the...