123 search results - page 23 / 25 » Design For Testability Method for CML Digital Circuits |
ASPDAC
2010
ACM
13 years 5 months ago
2010
ACM
Abstract--In nanometer-scale VLSI physical design, clock network becomes a major concern on determining the total performance of digital circuit. Clock skew and PVT (Process, Volta...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
ISCAS
2005
IEEE
14 years 1 months ago
2005
IEEE
Recent work has shown that the use of switched current methods can provide an effective route to implementation of analog IC functionality using a standard digital CMOS process. Fu...
PATMOS
2007
Springer
14 years 1 months ago
2007
Springer
—Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the...
TCAD
2008
13 years 7 months ago
2008
Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...