123 search results - page 2 / 25 » Design For Testability Method for CML Digital Circuits |
ICTAI
2002
IEEE
14 years 18 days ago
2002
IEEE
In order to reduce the time-to-market and simplify gatelevel test generation for digital integrated circuits, GAbased functional test generation techniques are proposed for behavi...
EURODAC
1994
IEEE
13 years 11 months ago
1994
IEEE
This paper presents a testability improvement method for digital systems described in VHDL behavioral specification. The method is based on testability analysis at registertransfe...
ICCAD
1996
IEEE
13 years 11 months ago
1996
IEEE
This paper presents a tutorial on mixed-signal testing. Our focus is on testing the analog portion of the mixed-signal device, as the digital portion is handled in the usual way. ...
DAC
1991
ACM
13 years 11 months ago
1991
ACM
-Conventionallyself-test hardware is added after synthesis is completed. For highly sequential circuits like controllersthis design method eitherleads to high hardware overheadsor ...
DAC
2009
ACM
14 years 8 months ago
2009
ACM
State elements are increasingly vulnerable to soft errors due to their decreasing size, and the fact that latched errors cannot be completely eliminated by electrical or timing ma...