The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
Jing-Jia Liou, Kwang-Ting Cheng, Deb Aditya Mukher...
Kth increasing uncertainties in the modeling and pmcessing of semiconductor devices, it is essential that the sources of failures be identified once the devices ure manufactured I...
Today's high-performance single-chip CMOS microprocessors are the most complex and challenging chip designs ever implemented. To stay on the leading edge, Digital's micro...
In this paper we describe how Network-on-Chip (NoC) will be the next major challenge to implementing complex and function-rich applications in advanced manufacturing processes at ...
Current advances in chip design and manufacturing have allowed IC manufacturing to approach the nanometer range. As the feature size scales down, greater variability is experience...