1799 search results - page 44 / 360 » Design considerations for MRAM |
123
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MICRO
2008
IEEE
15 years 10 months ago
2008
IEEE
—Negative bias temperature instability (NBTI), which reduces the lifetime of PMOS transistors, is becoming a growing reliability concern for sub-micrometer CMOS technologies. Par...
146
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ICC
2007
IEEE
15 years 10 months ago
2007
IEEE
— Future communication networks should be designed with the consideration of efficiently supporting intensive multicast applications. Network coding technique proposed recently ...
115
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GMP
2006
IEEE
15 years 10 months ago
2006
IEEE
Side actions contribute to mold cost by resulting in an additional manufacturing and assembly cost as well as by increasing the molding cycle time. Therefore, generating shapes of ...
139
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CSCWD
2001
Springer
15 years 8 months ago
2001
Springer
In manufacturing the interaction between the design of a product and the process to manufacture this product is studied in detail. Consider for example Material Requirements Plann...
122
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ASPDAC
1999
ACM
15 years 8 months ago
1999
ACM
In the past two decades, the simulated annealing technique has been considered as a powerful approach to handle many NP-hard optimization problems in VLSI designs. Recently, a new...