Simulation is still one of the most important subtasks when designing a VLSI circuit. However, more and more elements on a chip increase simulation runtimes. Especially on transis...
In order to achieve fault tolerance, highly reliable system often require the ability to detect errors as soon as they occur and prevent the speared of erroneous information throu...
Ever-increasing integrated circuit (IC) power densities and peak temperatures threaten reliability, performance, and economical cooling. To address these challenges, thermal analy...
The unique and unpredictable nature of silicon enables the use of physical unclonable functions (PUFs) for chip identification and authentication. Since the function of PUFs depen...
Lang Lin, Daniel E. Holcomb, Dilip Kumar Krishnapp...
We present a novel temperature/leakage sensor, developed for high-speed, low-power, monitoring of processors and complex VLSI chips. The innovative idea is the use of 4T SRAM cell...