37 search results - page 3 / 8 » Design of a Robust 8-Bit Microprocessor to Soft Errors |
TCAD
2008
13 years 7 months ago
2008
Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...
DSN
2007
IEEE
14 years 1 months ago
2007
IEEE
— Device scaling and large integration increase the vulnerability of microprocessors to transient errors. One of the structures where errors can be most harmful is the register ï...
ICCD
2008
IEEE
14 years 4 months ago
2008
IEEE
- This paper performs analysis and design of latches and flip-flops while considering the effect of event upsets caused by energetic particle hits. First it is shown that the conve...
IOLTS
2008
IEEE
14 years 1 months ago
2008
IEEE
— Error correcting coding is the dominant technique to achieve acceptable soft-error rates in memory arrays. In many modern circuits, the number of memory elements in the random ...
EMSOFT
2005
Springer
14 years 1 months ago
2005
Springer
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...