37 search results - page 5 / 8 » Design of a Robust 8-Bit Microprocessor to Soft Errors |
ICCAD
2007
IEEE
14 years 4 months ago
2007
IEEE
While circuit density and power efficiency increase with each major advance in IC technology, reliability with respect to soft errors tends to decrease. Current solutions to this...
ASPLOS
2004
ACM
14 years 27 days ago
2004
ACM
Recent studies have suggested that the soft-error rate in microprocessor logic will become a reliability concern by 2010. This paper proposes an efficient error detection techniqu...
HPCA
2008
IEEE
14 years 1 months ago
2008
IEEE
With reducing feature size, increasing chip capacity, and increasing clock speed, microprocessors are becoming increasingly susceptible to transient (soft) errors. Redundant multi...
HPCA
2008
IEEE
14 years 7 months ago
2008
IEEE
Increases in peak current draw and reductions in the operating voltages of processors continue to amplify the importance of dealing with voltage fluctuations in processors. Noise-...
ISCA
2007
IEEE
14 years 1 months ago
2007
IEEE
Transient faults due to particle strikes are a key challenge in microprocessor design. Driven by exponentially increasing transistor counts, per-chip faults are a growing burden. ...