124 search results - page 16 / 25 » Designing Reliable Digital Molecular Electronic Circuits |
VLSID
2009
IEEE
14 years 8 months ago
2009
IEEE
: The challenges in nano-CMOS circuit design include the following: variability, leakage, power, thermals, reliability, and yield. This talk will focus on interdependent considerat...
DATE
2010
IEEE
14 years 15 days ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
FPGA
2010
ACM
13 years 5 months ago
2010
ACM
Metastability is a phenomenon that can cause system failures in digital circuits. It may occur whenever signals are being transmitted across asynchronous or unrelated clock domain...
VLSID
2008
IEEE
14 years 7 months ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
This paper proposes an innovative methodology to perform and validate a Failure Mode and Effects Analysis (FMEA) at System-on-Chip (SoC) level. This is done in compliance with the...