124 search results - page 5 / 25 » Designing Reliable Digital Molecular Electronic Circuits |
DATE
1999
IEEE
13 years 11 months ago
1999
IEEE
In this paper, we consider the problem of maximizing the battery life (or duration of service) in battery-powered CMOS circuits. We first show that the battery efficiency (or utili...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
This paper introduces a CAD framework for co-simulation of hybrid circuits containing CMOS and SET (Single Electron Transistor) devices. An improved analytical model for SET is al...
ISQED
2006
IEEE
14 years 1 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
CAMP
2005
IEEE
14 years 1 months ago
2005
IEEE
Abstract— The promise of next-generation computer technologies, such as nano-electronics, implies a number of serious alterations to the design flow of digital circuits. One of ...
ISQED
2006
IEEE
14 years 1 months ago
2006
IEEE
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...