Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...
The foremost goal of superscalar processor design is to increase performance through the exploitation of instruction-level parallelism (ILP). Previous studies have shown that spec...
Abstract: This paper presents an approach to area optimization of arithmetic datapaths that perform polynomial computations over bit-vectors with finite widths. Examples of such de...
Abstract-- Process scaling and higher leakage power have resulted in increased power densities and elevated die temperatures. Due to the interdependence of temperature and leakage ...
Aseem Gupta, Nikil D. Dutt, Fadi J. Kurdahi, Kamal...