We present a new technique for generating compact dictionaries for cause-effect diagnosis in BIST. This approach relies on the use of three compact dictionaries: (i) D1, containin...
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...
In this paper, we present a novel and efticient approach to test MCM at the module as well as chip levels. Our design incorporates the concept of the multifrequency test method an...
Abstract— This paper presents an implementation-oriented breadthfirst tree search MIMO detector design solution. Techniques at algorithm and VLSI architecture levels are develop...
Building useful classification models can be a challenging endeavor, especially when training data is imbalanced. Class imbalance presents a problem when traditional classificatio...
Chris Seiffert, Taghi M. Khoshgoftaar, Jason Van H...