434 search results - page 15 / 87 » Detection and correction of design defects in object-oriente... |
VTS
2008
IEEE
14 years 1 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
VLSID
2000
IEEE
13 years 11 months ago
2000
IEEE
We address the problem of verifying the correctness of pre-silicon models of a microprocessor. We touch on the latest advances in this area by considering two different aspects of...
IPPS
2010
IEEE
13 years 5 months ago
2010
IEEE
We present new methods to extend data reliability of disks in RAID systems for applications like long term data archival. The proposed solutions extend existing algorithms to detec...
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
The detection of cell stability and data retention faults in SRAMs has been a time consuming process. In this paper we discuss a new design for test technique called Weak Write Tes...
ITC
1998
IEEE
13 years 11 months ago
1998
IEEE
We investigate defects in CMOS domino gates and derive the test conditions for them. Very-Low-Voltage Testing can improve the defect coverage, which we define as the maximum detec...