A deterministic partitioning technique for fault diagnosis in Scan-Based BIST is proposed. Properties of high quality partitions for improved fault diagnosis times are identified...
A deterministic-partitioning technique and an improved analysis scheme for fault diagnosis in Scan-Based BIST is proposed. The incorporation of the superposition principle to the ...
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
In a scan-based system with a large number of flip-flops, a major component of power is consumed during scanshift and clocking operation in test mode. In this paper, a novel scan-...
Bhargab B. Bhattacharya, Sharad C. Seth, Sheng Zha...