38 search results - page 5 / 8 » Device and Technology Challenges for Nanoscale CMOS |
IEICET
2006
13 years 9 months ago
2006
End of CMOS scaling has been discussed in many places since the late 90's. Even if the end of CMOS scaling is irrelevant, it is for sure that we are facing a turning point in...
MICRO
2008
IEEE
14 years 3 months ago
2008
IEEE
—Negative bias temperature instability (NBTI), which reduces the lifetime of PMOS transistors, is becoming a growing reliability concern for sub-micrometer CMOS technologies. Par...
CORR
2008
Springer
13 years 8 months ago
2008
Springer
Micromechanical devices like accelerometers or rotation sensors form an increasing segment beneath the devices supplying the consumer market. A hybrid integration approach to buil...
GLVLSI
2008
IEEE
14 years 3 months ago
2008
IEEE
Novel nano-scale devices have shown promising potential to overcome physical barriers faced by complementary metaloxide semiconductor (CMOS) technology in future circuit design. H...
DAC
2005
ACM
14 years 10 months ago
2005
ACM
As Si CMOS devices are scaled down into the nanoscale regime, current computer architecture approaches are reaching their practical limits. Future nano-architectures will confront...