The problem of failure diagnosis has received a considerable attention in the domain of reliability engineering, process control and computer science. The increasing stringent req...
The interconnection network plays an important role in the performance and energy consumption of a Networkon-Chip (NoC) system. In this paper, we propose a RDT(2,2,1)/α-based int...
The inductance effects become significant for sub-100nm process designs due to increasing interconnect lengths, lower interconnect resistance values and fast signal transition tim...
Santosh Shah, Arani Sinha, Li Song, Narain D. Aror...
For many years, CMOS process scaling has allowed a steady increase in the operating frequency and integration density of integrated circuits. Only recently, however, have we reach...
With the exponential reduction in the scaling of feature size, inter-wire coupling capacitance becomes the dominant part of load capacitance. Two problems are introduced by coupli...