787 search results - page 113 / 158 » Digital Algebra and Circuits |
DAC
2005
ACM
14 years 8 months ago
2005
ACM
Small, embedded integrated circuits (ICs) such as smart cards are vulnerable to so-called side-channel attacks (SCAs). The attacker can gain information by monitoring the power co...
VLSID
2007
IEEE
14 years 8 months ago
2007
IEEE
Crosstalk noise in the clock network of digital circuits is often detected late in the design cycle, sometimes as late as after first silicon. It is therefore necessary to fix cros...
ICCD
2003
IEEE
14 years 4 months ago
2003
IEEE
There is currently a huge gap between the two main technologies used to implement custom digital integrated circuit (IC) designs. At one end of the spectrum are field programmable...
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
Negative bias temperature instability (NBTI) has come to the forefront of critical reliability phenomena in advanced CMOS technology. In this paper, we propose a fast and accurate...
ISQED
2006
IEEE
14 years 1 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...