787 search results - page 20 / 158 » Digital Algebra and Circuits |
CP
1998
Springer
14 years 1 months ago
1998
Springer
In a faulty digital circuit, many (single) faulty gates may explain the observed findings. In this paper we are mostly concerned, not in obtaining alternative diagnoses, but rathe...
TVLSI
2008
13 years 8 months ago
2008
Thermal management is critical for integrated circuit (IC) design. With each new IC technology generation, feature sizes decrease, while operating speeds and package densities incr...
ASPDAC
2006
ACM
14 years 2 months ago
2006
ACM
With shrinking technology, the timing variation of a digital circuit is becoming the most important factor while designing a functionally reliable circuit. Gate sizing has emerged...
ICCD
2000
IEEE
14 years 5 months ago
2000
IEEE
This paper is concerned with the analysis and optimization of the ground bounce in digital CMOS circuits. First, an analytical method for calculating of the ground bounce is presen...
ASPDAC
2009
ACM
14 years 3 months ago
2009
ACM
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a major reliability concern in present-day digital circuit design. Further, with the recent usage of...