In a faulty digital circuit, many (single) faulty gates may explain the observed findings. In this paper we are mostly concerned, not in obtaining alternative diagnoses, but rathe...
Thermal management is critical for integrated circuit (IC) design. With each new IC technology generation, feature sizes decrease, while operating speeds and package densities incr...
Philip Y. Paik, Vamsee K. Pamula, Krishnendu Chakr...
With shrinking technology, the timing variation of a digital circuit is becoming the most important factor while designing a functionally reliable circuit. Gate sizing has emerged...
This paper is concerned with the analysis and optimization of the ground bounce in digital CMOS circuits. First, an analytical method for calculating of the ground bounce is presen...
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a major reliability concern in present-day digital circuit design. Further, with the recent usage of...
Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatneka...