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FMSD
2010
13 years 7 months ago
2010
Abstract Modeling and Simulation Aided Verification of Analog/MixedSignal Circuits S. Little and C. Myers (University of Utah, USA) Monday, July 14, 14:00-17:00 4 14:00-14:40 fSpic...
IPPS
2010
IEEE
13 years 6 months ago
2010
IEEE
This paper focuses on parallelization of the classic static timing analysis (STA) algorithm for verifying timing characteristics of digital integrated circuits. Given ever-increasi...
CORR
2010
Springer
13 years 4 months ago
2010
Springer
Combinational or Classical logic circuits dissipate heat for every bit of information that is lost. Information is lost when the input vector cannot be recovered from its correspon...
ISQED
2006
IEEE
14 years 3 months ago
2006
IEEE
The continuing VLSI technology scaling leads to increasingly significant power supply fluctuations, which need to be modeled accurately in circuit design and verification. Meanwhi...
DAC
2007
ACM
14 years 10 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...