Abstract Modeling and Simulation Aided Verification of Analog/MixedSignal Circuits S. Little and C. Myers (University of Utah, USA) Monday, July 14, 14:00-17:00 4 14:00-14:40 fSpic...
This paper focuses on parallelization of the classic static timing analysis (STA) algorithm for verifying timing characteristics of digital integrated circuits. Given ever-increasi...
Akintayo Holder, Christopher D. Carothers, Kerim K...
Combinational or Classical logic circuits dissipate heat for every bit of information that is lost. Information is lost when the input vector cannot be recovered from its correspon...
Md. Saiful Islam 0003, Muhammad Mahbubur Rahman, Z...
The continuing VLSI technology scaling leads to increasingly significant power supply fluctuations, which need to be modeled accurately in circuit design and verification. Meanwhi...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...