29 search results - page 4 / 6 » Digital Integrated Circuit Testing using Transient Signal An... |
DATE
2007
IEEE
14 years 2 months ago
2007
IEEE
This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysi...
IPSN
2010
Springer
13 years 9 months ago
2010
Springer
In-network processing is recommended for many sensor network applications to reduce communication and improve energy efficiency. However, constraints on memory, speed, and energy ...
ISCAS
2008
IEEE
14 years 2 months ago
2008
IEEE
—Integrated circuit (IC) design for a wireless BCI system is put forward in this paper. The system is composed of an electrode, a stimulator, antennas, and an integrated circuit ...
ICCD
2008
IEEE
14 years 4 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
We present applications of a recently developed automated nonlinear macromodelling approach to the important problem of macromodelling high-speed output buffers/drivers. Good nonl...