53 search results - page 2 / 11 » Dynamic instruction schedulers in a 3-dimensional integratio... |
MICRO
2008
IEEE
14 years 1 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
IEEEPACT
2007
IEEE
14 years 1 months ago
2007
IEEE
Continued scaling of CMOS technology to smaller transistor sizes makes modern processors more susceptible to both transient and permanent hardware faults. Circuitlevel techniques ...
MONET
2011
13 years 1 months ago
2011
Critical Infrastructures (CIs) such as the Power Grid play an important role in our lives. Of all important aspects of CIs, real-time data delivery is the most important one becaus...
ICDIM
2010
IEEE
13 years 4 months ago
2010
IEEE
Funded as part of the `Network Enabled Platforms' program the Health Services Virtual Organization (HSVO) Project has developed a network-enabled platform (NEP) consisting of...
EMSOFT
2005
Springer
14 years 6 days ago
2005
Springer
Power leakage constitutes an increasing fraction of the total power consumption in modern semiconductor technologies. Recent research efforts have tried to integrate architecture...