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ITC
2000
IEEE
101views Hardware» more  ITC 2000»
14 years 21 days ago
Reducing test data volume using external/LBIST hybrid test patterns
A common approachfor large industrial designs is to use logic built-in self-test (LBIST)followed by test data from an external tester. Because the fault coverage with LBIST alone ...
Debaleena Das, Nur A. Touba
FPL
2007
Springer
99views Hardware» more  FPL 2007»
14 years 6 days ago
Disjoint Pattern Enumeration for Custom Instructions Identification
Extensible processors allow addition of application-specific custom instructions to the core instruction set architecture. These custom instructions are selected through an analys...
Pan Yu, Tulika Mitra
PR
2006
112views more  PR 2006»
13 years 8 months ago
RBF-based neurodynamic nearest neighbor classification in real pattern space
Superposition of radial basis functions centered at given prototype patterns constitutes one of the most suitable energy forms for gradient systems that perform nearest neighbor c...
Mehmet Kerem Müezzinoglu, Jacek M. Zurada
ICIP
2006
IEEE
14 years 10 months ago
Hardware Computation of Moment Functions in a Silicon Retina using Binary Patterns
We present in this paper a method for implementing moment functions in a CMOS retina for shape recognition applications. The method is based on the use of binary patterns and it a...
Olivier Aubreton, Lew Fock Chong Lew Yan Voon, Guy...
SIGSOFT
2004
ACM
14 years 9 months ago
Implementing protocols via declarative event patterns
This paper introduces declarative event patterns (DEPs) as a means to implement protocols while improving their traceability, comprehensibility, and maintainability. DEPs are desc...
Robert J. Walker, Kevin Viggers