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DATE
2005
IEEE
104views Hardware» more  DATE 2005»
14 years 1 months ago
Defect Aware Test Patterns
A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled defects. The propose...
Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen W...
COLING
2008
13 years 8 months ago
When is Self-Training Effective for Parsing?
Self-training has been shown capable of improving on state-of-the-art parser performance (McClosky et al., 2006) despite the conventional wisdom on the matter and several studies ...
David McClosky, Eugene Charniak, Mark Johnson
EMNLP
2010
13 years 5 months ago
Improved Fully Unsupervised Parsing with Zoomed Learning
We introduce a novel training algorithm for unsupervised grammar induction, called Zoomed Learning. Given a training set T and a test set S, the goal of our algorithm is to identi...
Roi Reichart, Ari Rappoport
IEEEPACT
2009
IEEE
14 years 2 months ago
StealthTest: Low Overhead Online Software Testing Using Transactional Memory
—Software testing is hard. The emergence of multicore architectures and the proliferation of bugprone multithreaded software makes testing even harder. To this end, researchers h...
Jayaram Bobba, Weiwei Xiong, Luke Yen, Mark D. Hil...
ICSM
2005
IEEE
14 years 1 months ago
Test Suite Reduction with Selective Redundancy
Software testing is a critical part of software development. Test suite sizes may grow significantly with subsequent modifications to the software over time. Due to time and res...
Dennis Jeffrey, Neelam Gupta