ABSTRACT - A multiple pass A/D conversion technique is proposed for mixed-signal test applications. Only a single on-chip comparator and sample-and-hold circuit is required to digi...
An objective of DSP testing should be to ensure that any errors due to missed faults are infrequent compared to a circuit’s intrinsic errors, such as overflow. A method is prop...
As Si CMOS devices are scaled down into the nanoscale regime, current computer architecture approaches are reaching their practical limits. Future nano-architectures will confront...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...
We propose a new technique for hardware synthesis from higherorder functional languages with imperative features based on Reynolds's Syntactic Control of Interference. The re...
—Clock jitter and its effects on signal-to-noise ratio (SNR) were widely investigated in the published literatures. However, most of the issues mainly focused on white-Gaussian-n...