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ASAP
2005
IEEE
14 years 1 months ago
2005
IEEE
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...
DAC
2010
ACM
13 years 10 months ago
2010
ACM
Effective system verification requires good specifications. The lack of sufficient specifications can lead to misses of critical bugs, design re-spins, and time-to-market slips. I...
OSDI
1996
ACM
13 years 8 months ago
1996
ACM
This paper describes a novel approach to providingmodular and extensible operating system functionality and encapsulated environments based on a synthesis of microkernel and virtu...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
DATE
1999
IEEE
13 years 11 months ago
1999
IEEE
Dynamically reconfigurable embedded systems offer potential for higher performance as well as adaptability to changing system requirements at low cost. Such systems employ run-tim...