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ICCAD
2010
IEEE
121views Hardware» more  ICCAD 2010»
15 years 2 months ago
Multi-Wafer Virtual Probe: Minimum-cost variation characterization by exploring wafer-to-wafer correlation
In this paper, we propose a new technique, referred to as MultiWafer Virtual Probe (MVP) to efficiently model wafer-level spatial variations for nanoscale integrated circuits. Tow...
Wangyang Zhang, Xin Li, Emrah Acar, Frank Liu, Rob...
ICCAD
2010
IEEE
229views Hardware» more  ICCAD 2010»
15 years 2 months ago
Obstacle-avoiding rectilinear Steiner minimum tree construction: An optimal approach
In this paper, we present an efficient method to solve the obstacle-avoiding rectilinear Steiner minimum tree (OARSMT) problem optimally. Our work is a major improvement over the w...
Tao Huang, Evangeline F. Y. Young
MICRO
2010
IEEE
167views Hardware» more  MICRO 2010»
15 years 2 months ago
Erasing Core Boundaries for Robust and Configurable Performance
Single-thread performance, reliability and power efficiency are critical design challenges of future multicore systems. Although point solutions have been proposed to address thes...
Shantanu Gupta, Shuguang Feng, Amin Ansari, Scott ...
PIMRC
2010
IEEE
15 years 2 months ago
Low-complexity iteration control for MIMO-BICM systems
Air bandwidth is a precious resource for wireless communication. Multiple-antenna (MIMO) systems enable an increase in channel capacity without increasing the air bandwidth. An ite...
C. Gimmler, Timo Lehnigk-Emden, Norbert Wehn
ETS
2009
IEEE
99views Hardware» more  ETS 2009»
15 years 2 months ago
On Minimization of Peak Power for Scan Circuit during Test
Scan circuit generally causes excessive switching activity compared to normal circuit operation. The higher switching activity in turn causes higher peak power supply current whic...
Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, ...