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DFT
2006
IEEE
14 years 1 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
ASPDAC
2006
ACM
13 years 11 months ago
2006
ACM
The verification of modern computing systems has grown to dominate the cost of system design, often with limited success as designs continue to be released with latent bugs. This t...
EVOW
2006
Springer
13 years 11 months ago
2006
Springer
In this paper, we introduce a novel objective function for the hierarchical clustering of data from distance matrices, a very relevant task in Bioinformatics. To test the robustnes...
ISCAS
2007
IEEE
14 years 1 months ago
2007
IEEE
—A Built-In Self-Test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixedsignal systems, is...
JCDL
2004
ACM
14 years 29 days ago
2004
ACM
We describe PhotoCompas, a system that utilizes the time and location information embedded in digital photographs to automatically organize a personal photo collection. PhotoCompa...