A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
Alireza Sarvi, Carthik A. Sharma, Ronald F. DeMara
This paper presents a new conceptual model, the XBWModel. Distributed computing is becoming a cost effective way to implement safety critical control systems. To support the devel...
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
Interconnects have been shown to be a dominant source of energy consumption in modern day System-on-Chip (SoC) designs. With a large (and growing) number of electronic systems bei...
Vijay Raghunathan, Mani B. Srivastava, Rajesh K. G...
Many sensor nodes contain resource constrained microcontrollers where user level applications, operating system components, and device drivers share a single address space with no...