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VTS
2002
IEEE
108views Hardware» more  VTS 2002»
14 years 2 months ago
On Using Efficient Test Sequences for BIST
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
René David, Patrick Girard, Christian Landr...
PVLDB
2008
108views more  PVLDB 2008»
13 years 9 months ago
Taming verification hardness: an efficient algorithm for testing subgraph isomorphism
Graphs are widely used to model complicated data semantics in many applications. In this paper, we aim to develop efficient techniques to retrieve graphs, containing a given query...
Haichuan Shang, Ying Zhang, Xuemin Lin, Jeffrey Xu...
ESWS
2007
Springer
14 years 4 months ago
JAWS: A Javascript API for the Efficient Testing and Integration of Semantic Web Services
Semantic Web Services (SWS) hold a lot of potential to the future of the Semantic Web. In this area, a number of tools have been developed to facilitate their definition and deploy...
David A. Ostrowski
ETS
2009
IEEE
98views Hardware» more  ETS 2009»
13 years 7 months ago
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
Stephan Eggersglüß, Rolf Drechsler
ICST
2008
IEEE
14 years 4 months ago
Efficient Test Data Generation for Variables with Complex Dependencies
This paper introduces a new method for generating test data that combines the benefits of equivalence partitioning, boundary value analysis and cause-effect analysis. It is suitab...
Armin Beer, Stefan Mohacsi