2174 search results - page 24 / 435 » Efficient Testing of Forecasts |
DDECS
2007
IEEE
14 years 4 months ago
2007
IEEE
: In this paper we study Complex Read Faults in SRAMs, a combination of various malfunctions that affect the read operation in nanoscale memories. All the memory elements involved ...
DATE
2004
IEEE
14 years 1 months ago
2004
IEEE
The increasing complexity of system-on-chip (SOC) integrated circuits has spurred the development of versatile automatic test equipment (ATE) that can simultaneously drive differe...
FUIN
2008
13 years 10 months ago
2008
We study runtime distributions of subsumption testing. On graph data randomly sampled from two different generative models we observe a gradual growth of the tails of the distribut...
DAC
1998
ACM
14 years 2 months ago
1998
ACM
This papers describes a new, fast and economical methodology to test linear analog circuits based on adaptive algorithms. To the authors knowledge, this is the first time such tec...
TACAS
2010
Springer
13 years 7 months ago
2010
Springer
The choice of where a thread scheduling algorithm preempts one thread in order to execute another is essential to reveal concurrency errors such as atomicity violations, livelocks,...