2174 search results - page 42 / 435 » Efficient Testing of Forecasts |
DAC
2003
ACM
14 years 3 months ago
2003
ACM
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...
TFS
2008
13 years 9 months ago
2008
A reliable monitoring system is critically needed in a wide range of industries to detect the occurrence of a fault to prevent machinery performance degradation, malfunction, and s...
DSD
2005
IEEE
14 years 3 months ago
2005
IEEE
The increasing amount of test data needed to test SOC (System-on-Chip) entails efficient design of the TAM (test access mechanism), which is used to transport test data inside the...
VTS
2003
IEEE
14 years 3 months ago
2003
IEEE
In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) arc...
JAMDS
2000
13 years 9 months ago
2000
Bian and Dickey (1996) developed a robust Bayesian estimator for the vector of regression coefficients using a Cauchy-type g-prior. This estimator is an adaptive weighted average o...