2174 search results - page 55 / 435 » Efficient Testing of Forecasts |
ETS
2007
IEEE
14 years 4 months ago
2007
IEEE
An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. Therefore embedded memories are commonly equipped with spare r...
CSREAESA
2008
13 years 11 months ago
2008
A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
CAV
2006
Springer
14 years 1 months ago
2006
Springer
CUTE, a Concolic Unit Testing Engine for C and Java, is a tool to systematically and automatically test sequential C programs (including pointers) and concurrent Java programs. CUT...
DATE
1999
IEEE
14 years 2 months ago
1999
IEEE
As an at-speed solution to board-level interconnect testing, an enhanced boundary-scan architecture utilizing a combination of slightly modified boundary-scan cells and a user-def...
EOR
2002
13 years 9 months ago
2002
This paper discusses various statistics for testing hypotheses regarding returns to scale in the context of non-parametric models of technical efficiency. In addition, the paper p...