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EUROGP
2003
Springer
101views Optimization» more  EUROGP 2003»
14 years 3 months ago
An Enhanced Framework for Microprocessor Test-Program Generation
Test programs are fragment of code, but, unlike ordinary application programs, they are not intended to solve a problem, nor to calculate a function. Instead, they are supposed to ...
Fulvio Corno, Giovanni Squillero
ICCAD
1999
IEEE
66views Hardware» more  ICCAD 1999»
14 years 2 months ago
Test scheduling for core-based systems
We present optimal solutions to the test scheduling problem for core-based systems. We show that test scheduling is equivalent to the m-processor open-shop scheduling problem and ...
Krishnendu Chakrabarty
ITC
1997
IEEE
92views Hardware» more  ITC 1997»
14 years 2 months ago
A Novel Functional Test Generation Method for Processors Using Commercial ATPG
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...
Raghuram S. Tupuri, Jacob A. Abraham
VTS
1997
IEEE
90views Hardware» more  VTS 1997»
14 years 2 months ago
SHOrt voltage elevation (SHOVE) test for weak CMOS ICs
A stress procedure for reliability screening, SHOrt Voltage Elevation (SHOVE) test, is analyzed here. During SHOVE, test vectors are run at higher-than-normal supply voltage for a...
Jonathan T.-Y. Chang, Edward J. McCluskey
DATE
2006
IEEE
73views Hardware» more  DATE 2006»
14 years 4 months ago
Minimizing test power in SRAM through reduction of pre-charge activity
In this paper we analyze the test power of SRAM memories and demonstrate that the full functional precharge activity is not necessary during test mode because of the predictable a...
Luigi Dilillo, Paul M. Rosinger, Bashir M. Al-Hash...