2174 search results - page 79 / 435 » Efficient Testing of Forecasts |
TSE
2010
13 years 4 months ago
2010
Recent advances in mechanical techniques for systematic testing have increased our ability to automatically find subtle bugs, and hence to deploy more dependable software. This pap...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
—This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose t...
DATE
2004
IEEE
14 years 1 months ago
2004
IEEE
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...
ICES
2000
Springer
14 years 1 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
PTS
2007
13 years 11 months ago
2007
The interrelationship between software faults and failures is quite intricate and obtaining a meaningful characterization of it would definitely help the testing community in decid...