203 search results - page 4 / 41 » Efficient Type Inclusion Tests |
VTS
2002
IEEE
14 years 8 days ago
2002
IEEE
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
BMCBI
2010
13 years 7 months ago
2010
Background: High-throughput automated sequencing has enabled an exponential growth rate of sequencing data. This requires increasing sequence quality and reliability in order to a...
ETS
2009
IEEE
13 years 5 months ago
2009
IEEE
Scan circuit generally causes excessive switching activity compared to normal circuit operation. The higher switching activity in turn causes higher peak power supply current whic...
ICIP
1998
IEEE
13 years 11 months ago
1998
IEEE
In this paper we propose a method for discrimination of underlying textural structures from spotlight-mode synthetic aperture radar (SAR) returns by using a tomographic data acqui...
STOC
2005
ACM
14 years 7 months ago
2005
ACM
We construct an efficient probabilistic algorithm that, given a finite set with a binary operation, tests if it is an abelian group. The distance used is an analogue of the edit d...