- This paper extends the depth first search (DFS) used in the previously proposed witness string method for generating efficient test vectors. A state pruning method is added that ...
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwa...
Pre-Pruning and Post-Pruning are two standard methods of dealing with noise in concept learning. Pre-Pruning methods are very efficient, while Post-Pruning methods typically are m...
A method is presented for identifying primitive path-delay faults in non-scan sequential circuits and generating robust tests for all robustly testable primitive faults. It uses t...
We present a Mutation-based Validation Paradigm (MVP) technology that can handle complete high-level microprocessor implementations and is based on explicit design error modeling, ...