127 search results - page 4 / 26 » Efficiently generating test vectors with state pruning |
MTV
2007
IEEE
14 years 1 months ago
2007
IEEE
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
The gain-based technology mapping paradigm has been successfully employed for finding minimum delay and minimum area mappings. However, existing gain-based technology mappers fail...
ICES
2000
Springer
13 years 11 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
ICST
2009
IEEE
14 years 2 months ago
2009
IEEE
Constraint solving lies at the heart of several specification-based approaches to automated testing. Korat is a previously developed algorithm for solving constraints in Java pro...
EH
2000
IEEE
13 years 12 months ago
2000
IEEE
How do we know the correctness of an evolved circuit? While Evolutionary Hardware is exhibiting its effectiveness, we argue that it is very difficult to design a large-scale digit...