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Electromigration-Aware Physical Design of Integrated Circuit...
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MICRO
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Variation-tolerant non-uniform 3D cache management in die stacked multicore processor
15 years 11 months ago
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Process variations in integrated circuits have significant impact on their performance, leakage and stability. This is particularly evident in large, regular and dense structures...
Bo Zhao, Yu Du, Youtao Zhang, Jun Yang 0002
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