9 search results - page 1 / 2 » Electromigration-aware redundant via insertion |
ASPDAC
2009
ACM
13 years 10 months ago
2009
ACM
—Redundant via insertion is a widely recommended technique to enhance the via yield and reliability. In this paper, the post-routing redundant via insertion problem is transforme...
ASPDAC
2005
ACM
13 years 9 months ago
2005
ACM
- Redundant via insertion is a good solution to reduce the yield loss by via failure. However, the existing methods are all post-layout optimizations that insert redundant via afte...
ASPDAC
2006
ACM
14 years 1 months ago
2006
ACM
- Reducing the yield loss due to via failure is one of the important problems in design for manufacturability. A well known and highly recommended method to improve via yield/relia...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
- Redundant via insertion and line end extension employed in the post-routing stage are two well known and highly recommended techniques to reduce yield loss due to via failure. Ho...
GLVLSI
2009
IEEE
14 years 2 months ago
2009
IEEE
Based on the insertion of internal and external redundant wires into L-type and U-type wires, an efficient two-phase reliability-driven insertion algorithm is proposed to insert r...